| Manufacturer | Part # | Datasheet | Description |
Dallas Semiconductor |
DS21372
|
214Kb / 21P |
3.3V Bit Error Rate Tester BERT
|
|
DS2172
|
213Kb / 21P |
Bit Error Rate Tester BERT
|
fujitsu semiconductor |
MB1426
|
734Kb / 15P |
16 BIT ERROR CHECKING & CORRECTION
|
Agilent(Hewlett-Packard... |
N2101B
|
255Kb / 4P |
Bit Error Ratio Tester
|
Texas Instruments |
TLC5540
|
879Kb / 24P |
8-Bit Resolution Differential Linearity Error Integral Linearity Error
|
Union Semiconductor, In... |
UM488
|
363Kb / 17P |
Enhanced Slew-Rate Limiting Facilitates Error-Free Data Transmission
|
TEKTRONIX, INC. |
BSX
|
1Mb / 38P |
Bit Error Rate Tester
|
Maxim Integrated Produc... |
MAX17135EVKIT
|
2Mb / 12P |
Measures Remote Diode Temperature
Rev 1; 1/12 |
|
DS2172
|
180Kb / 22P |
Bit Error Rate Tester (BERT)
101000 |
|
DS21372
|
180Kb / 22P |
3.3V Bit Error Rate Tester (BERT)
101000 |
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